Charge Collection

Characterization of Charge Collection in Various Sensor Materials Using Energetic Protons and Timepix Device

"Michale, máte příští týden čas?"
"No .. mám."
"To je dobře, letíte měřit na urychlovač do Kanady ... už jsme vám koupili letenku."
:D
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Služebky

Universite de Montreal, Kanada
21. 5. 2011 - 26. 5. 2011
Experimenty s Si, CdTe a GaAs senzory ve svazku energetických protonů

Universite de Montreal, Kanada
10. 3. 2008 - 17. 3. 2008
Experiment: detekce těžkých nabitých částic

Prezentace

IEEE NSS/MIC/RTSD 2011 - Nuclear Science Symposium and Medical Imaging Conference, Workshop On Room-Temperature Semiconductor X-Ray And Gamma-Ray Detectors, Valencia
23. 10. 2011 - 30. 10. 2011
Characterization of Charge Collection in Various Sensor Materials Using Energetic Protons and Timepix Device
Poster

Publikace

Characterization of Charge Collection in Various Semiconductor Sensors with Energetic Protons and Timepix Device
M. Platkevič, P. Čermák, J. Jakůbek, S. Pospíšil, I. Štekl, Z. Vykydal, J. Žemlička, C. Leroy, P. Allard, G. Bergeron, P. Soueid, C. Teyssier, R. Yapoudjian, M. Fiederle, A. Fauler, G. Chelkov, O. Toblanov, A. Tyazhev, J. Visser
2011 IEEE Nuclear Science Symposium Conference Record, Pages: 4715 - 4719, doi: 10.1109/NSSMIC.2011.6154765 (2011)

Study of charge sharing in a silicon pixel detector with heavy ionizing particles interacting with a Medipix2 device
J. Bouchami, A. Gutierrez, A. Houdayer, J. Idarraga, J. Jakůbek, C. Lebel, C. Leroy, J. Martin, M. Platkevič, S. Pospíšil
NIM A, Vol. 607, Issue 1, p. 196-198 (2009)

Study of the Charge Sharing Effect with Protons Interacting with aMedipix2 Detector
J. Bouchami, A. Gutierrez, J. Jakůbek, C. Leroy, M. Platkevič, S. Pospíšil, J. Martin
AIP Conference Proceedings CP 1204 (2009) 175-176 (2009)

Granty

Využití radionuklidů a ionizujícího záření
- MSM6840770040, Ministerstvo školství, mládeže a tělovýchovy (MŠMT) , 2007 - 2012

Příprava, modifikace a charakterizace materiálů energetickým zářením
- LC06041, Centra základního výzkumu, Ministerstvo školství, mládeže a tělovýchovy (MŠMT) , 2006 - 2011

Monochromatic protons from a Van de Graaff Tandem accelerator of the University of Montreal (UMTA) were scattered by a thin gold foil.

Abstract– In this work we use the Timepix chip as a multichannel tester for evaluation of properties of different semiconductor sensors. Different sensors bump-bonded to a Timepix readout chip and exposed to energetic protons with different incident angles and energies have been investigated. Data from each recorded proton track were processed individually. The extent of the charge sharing effect was evaluated along the proton track at different sensor depths. The level of charge sharing is affected by the time of charge collection which is related to the local intensity of the electric field in the sensor. This method can provide a 3D map of the electric field in the whole sensor volume.

The Timepix readout chip can be bump-bonded to different semiconductor sensor materials such as Si, GaAs and CdTe.

B. Measurement setup Protons with energies up to 11.4 MeV hit the Timepix detector, operated in ToT mode, under various angles after Rutherford Backscattering of an accelerator particle beam on a 0.12 mm thick gold foil. The foil is located in a contiguous accelerator chamber, at an angle of 45° with respect to the beam direction. The detector is fully controlled by Fitpix interface [3] and Pixelman software [4]. Illustration of layout is given in Fig. 2.